Features
- WLI optical system can capture 3D data to perform 3D surface texture analysis and 3D roughness analysis. You can also perform dimension measurement and cross-section measurement at a specific height using the 3D data.
- The Point From Focus (PFF) function enables the 3D measurement with multi cross-section images. Scanning the object by auto focusing the objective lens can capture multiple cross-section images (image contrasts) at different heights. Thus obtaining 3D shape data from such images.
Hyper Quick Vision White Light Interferometer
- High accuracy for non-contact dimensional measurement
- Using white light interferometer, the Quick Vision Series can perform highly accurate 3D measurements in microscopic areas for surface analysis, small-diameter hole depth, and line and space measurements on circuit boards.
HIGH PRECISION & RESOLUTION
- NON-CONTACT 2D/3D MEASUREMENT
- White light interferometer (WLI optical head) applied to vision measuring systems enables a wide range of powerful measurements, from 2D measurement of coordinates and dimensions, surface analysis in microscopic areas, depth measurement of small-diameter holes, and to high-precision 3D measurement of wiring dimensions on a printed circuit board.
HIGH CAPABILITY OF HANDLING
- A WIDE VARIETY OF MEASUREMENT SURFACES
- WLI method can handle a wide variety of measurement surfaces including diffusing surfaces and mirrored surfaces.
- Using Mitutoyo’s proprietary algorithm, WLI can also handle surfaces with large brightness differences, e.g., where plastic and metal coexist in mixed states.
POWERFUL SUPPORTING SOFTWARE
- QV3DPAK
- Synthesizes 3D shape data from interference fringes to display shapes or outputs point cloud data to external sources.
- 3D data can be transferred to the shape/evaluation analysis software (optional) to implement shape measurement and surface analysis.
